From 0af0c86532e68d5c2a548af5e1ea780940e46cdd Mon Sep 17 00:00:00 2001
From: Ruben Ayrapetyan <r.ayrapetyan@samsung.com>
Date: Fri, 18 Jul 2014 15:27:38 +0400
Subject: [PATCH] Unit test: single var_decl, followed by exitval.

---
 .../test_var_decl_opcode_in_decl_lex_env.c    | 39 +++++++++++++++++++
 1 file changed, 39 insertions(+)
 create mode 100644 tests/unit/test_var_decl_opcode_in_decl_lex_env.c

diff --git a/tests/unit/test_var_decl_opcode_in_decl_lex_env.c b/tests/unit/test_var_decl_opcode_in_decl_lex_env.c
new file mode 100644
index 000000000..a1419ac98
--- /dev/null
+++ b/tests/unit/test_var_decl_opcode_in_decl_lex_env.c
@@ -0,0 +1,39 @@
+/* Copyright 2014 Samsung Electronics Co., Ltd.
+ *
+ * Licensed under the Apache License, Version 2.0 (the "License");
+ * you may not use this file except in compliance with the License.
+ * You may obtain a copy of the License at
+ *
+ *     http://www.apache.org/licenses/LICENSE-2.0
+ *
+ * Unless required by applicable law or agreed to in writing, software
+ * distributed under the License is distributed on an "AS IS" BASIS
+ * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ * See the License for the specific language governing permissions and
+ * limitations under the License.
+ */
+
+#include "globals.h"
+#include "interpreter.h"
+#include "mem-allocator.h"
+#include "opcodes.h"
+
+/**
+ * Unit test's main function.
+ */
+int
+main( int __unused argc,
+      char __unused **argv)
+{
+  const OPCODE test_program[] = {
+    getop_var_decl( 0),
+    getop_exitval( 0)
+  };
+
+  mem_Init();
+
+  init_int( test_program);
+
+  return run_int() ? 0
+                   : 1;
+} /* main */